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IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences 2008 E91-A(4):1077-1083; doi:10.1093/ietfec/e91-a.4.1077
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Copyright © 2008 The Institute of Electronics, Information and Communication Engineers

Special Section on Selected Papers from the 20th Workshop on Circuits and Systems in Karuizawa -- Papers

Prevention in a Chip of EMI Noise Caused by X'tal Oscillator

Atsushi KUROKAWA1, Hiroshi FUJITA1 and Tetsuya IBE1

1 The authors are with SANYO Semiconductor Co., Ltd., Gunma-ken, 370-0596 Japan. E-mail: Atsushi.Kurokawa{at}sanyo.co.jp


  Abstract

Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a X'tal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the method's effectiveness in suppressing noise.

Key Words: EMI, crystal oscillator, noise, decoupling capacitor

Manuscript received June 26, 2007. Manuscript revised October 6, 2007.


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